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[freertos] / FreeRTOS / Demo / CORTEX_A9_Zynq_ZC702 / RTOSDemo_bsp / ps7_cortexa9_0 / libsrc / standalone_v5_4 / src / xil_testmem.c
diff --git a/FreeRTOS/Demo/CORTEX_A9_Zynq_ZC702/RTOSDemo_bsp/ps7_cortexa9_0/libsrc/standalone_v5_4/src/xil_testmem.c b/FreeRTOS/Demo/CORTEX_A9_Zynq_ZC702/RTOSDemo_bsp/ps7_cortexa9_0/libsrc/standalone_v5_4/src/xil_testmem.c
deleted file mode 100644 (file)
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@@ -1,882 +0,0 @@
-/******************************************************************************
-*
-* Copyright (C) 2009 - 2015 Xilinx, Inc. All rights reserved.
-*
-* Permission is hereby granted, free of charge, to any person obtaining a copy
-* of this software and associated documentation files (the "Software"), to deal
-* in the Software without restriction, including without limitation the rights
-* to use, copy, modify, merge, publish, distribute, sublicense, and/or sell
-* copies of the Software, and to permit persons to whom the Software is
-* furnished to do so, subject to the following conditions:
-*
-* The above copyright notice and this permission notice shall be included in
-* all copies or substantial portions of the Software.
-*
-* Use of the Software is limited solely to applications:
-* (a) running on a Xilinx device, or
-* (b) that interact with a Xilinx device through a bus or interconnect.
-*
-* THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
-* IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
-* FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL
-* XILINX  BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY,
-* WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF
-* OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE
-* SOFTWARE.
-*
-* Except as contained in this notice, the name of the Xilinx shall not be used
-* in advertising or otherwise to promote the sale, use or other dealings in
-* this Software without prior written authorization from Xilinx.
-*
-******************************************************************************/
-/*****************************************************************************/
-/**
-*
-* @file xil_testmem.c
-*
-* Contains the memory test utility functions.
-*
-* <pre>
-* MODIFICATION HISTORY:
-*
-* Ver    Who    Date    Changes
-* ----- ---- -------- -----------------------------------------------
-* 1.00a hbm  08/25/09 First release
-* </pre>
-*
-*****************************************************************************/
-
-/***************************** Include Files ********************************/
-#include "xil_testmem.h"
-#include "xil_io.h"
-#include "xil_assert.h"
-
-/************************** Constant Definitions ****************************/
-/************************** Function Prototypes *****************************/
-
-static u32 RotateLeft(u32 Input, u8 Width);
-
-/* define ROTATE_RIGHT to give access to this functionality */
-/* #define ROTATE_RIGHT */
-#ifdef ROTATE_RIGHT
-static u32 RotateRight(u32 Input, u8 Width);
-#endif /* ROTATE_RIGHT */
-
-
-/*****************************************************************************/
-/**
-*
-* Perform a destructive 32-bit wide memory test.
-*
-* @param    Addr is a pointer to the region of memory to be tested.
-* @param    Words is the length of the block.
-* @param    Pattern is the constant used for the constant pattern test, if 0,
-*           0xDEADBEEF is used.
-* @param    Subtest is the test selected. See xil_testmem.h for possible
-*          values.
-*
-* @return
-*
-* - 0 is returned for a pass
-* - -1 is returned for a failure
-*
-* @note
-*
-* Used for spaces where the address range of the region is smaller than
-* the data width. If the memory range is greater than 2 ** Width,
-* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
-* repeat on a boundry of a power of two making it more difficult to detect
-* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
-* tests suffer the same problem. Ideally, if large blocks of memory are to be
-* tested, break them up into smaller regions of memory to allow the test
-* patterns used not to repeat over the region tested.
-*
-*****************************************************************************/
-s32 Xil_TestMem32(u32 *Addr, u32 Words, u32 Pattern, u8 Subtest)
-{
-       u32 I;
-       u32 j;
-       u32 Val;
-       u32 FirtVal;
-       u32 WordMem32;
-       s32 Status = 0;
-
-       Xil_AssertNonvoid(Words != (u32)0);
-       Xil_AssertNonvoid(Subtest <= (u8)XIL_TESTMEM_MAXTEST);
-       Xil_AssertNonvoid(Addr != NULL);
-
-       /*
-        * variable initialization
-        */
-       Val = XIL_TESTMEM_INIT_VALUE;
-       FirtVal = XIL_TESTMEM_INIT_VALUE;
-
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INCREMENT)) {
-               /*
-                * Fill the memory with incrementing
-                * values starting from 'FirtVal'
-                */
-               for (I = 0U; I < Words; I++) {
-                       *(Addr+I) = Val;
-                       Val++;
-               }
-
-               /*
-                * Restore the reference 'Val' to the
-                * initial value
-                */
-               Val = FirtVal;
-
-               /*
-                * Check every word within the words
-                * of tested memory and compare it
-                * with the incrementing reference
-                * Val
-                */
-
-               for (I = 0U; I < Words; I++) {
-                       WordMem32 = *(Addr+I);
-
-                       if (WordMem32 != Val) {
-                               Status = -1;
-                               goto End_Label;
-                       }
-
-                       Val++;
-               }
-       }
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKONES)) {
-               /*
-                * set up to cycle through all possible initial
-                * test Patterns for walking ones test
-                */
-
-               for (j = 0U; j < (u32)32; j++) {
-                       /*
-                        * Generate an initial value for walking ones test
-                        * to test for bad data bits
-                        */
-
-                       Val = (1U << j);
-
-                       /*
-                        * START walking ones test
-                        * Write a one to each data bit indifferent locations
-                        */
-
-                       for (I = 0U; I < (u32)32; I++) {
-                               /* write memory location */
-                               *(Addr+I) = Val;
-                               Val = (u32) RotateLeft(Val, 32U);
-                       }
-
-                       /*
-                        * Restore the reference 'val' to the
-                        * initial value
-                        */
-                       Val = 1U << j;
-
-                       /* Read the values from each location that was
-                        * written */
-                       for (I = 0U; I < (u32)32; I++) {
-                               /* read memory location */
-
-                               WordMem32 = *(Addr+I);
-
-                               if (WordMem32 != Val) {
-                                       Status = -1;
-                                       goto End_Label;
-                               }
-
-                               Val = (u32)RotateLeft(Val, 32U);
-                       }
-               }
-       }
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKZEROS)) {
-               /*
-                * set up to cycle through all possible
-                * initial test Patterns for walking zeros test
-                */
-
-               for (j = 0U; j < (u32)32; j++) {
-
-                       /*
-                        * Generate an initial value for walking ones test
-                        * to test for bad data bits
-                        */
-
-                       Val = ~(1U << j);
-
-                       /*
-                        * START walking zeros test
-                        * Write a one to each data bit indifferent locations
-                        */
-
-                       for (I = 0U; I < (u32)32; I++) {
-                               /* write memory location */
-                               *(Addr+I) = Val;
-                               Val = ~((u32)RotateLeft(~Val, 32U));
-                       }
-
-                       /*
-                        * Restore the reference 'Val' to the
-                        * initial value
-                        */
-
-                       Val = ~(1U << j);
-
-                       /* Read the values from each location that was
-                        * written */
-                       for (I = 0U; I < (u32)32; I++) {
-                               /* read memory location */
-                               WordMem32 = *(Addr+I);
-                               if (WordMem32 != Val) {
-                                       Status = -1;
-                                       goto End_Label;
-                               }
-                               Val = ~((u32)RotateLeft(~Val, 32U));
-                       }
-
-               }
-       }
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INVERSEADDR)) {
-               /* Fill the memory with inverse of address */
-               for (I = 0U; I < Words; I++) {
-                       /* write memory location */
-                       Val = (u32) (~((INTPTR) (&Addr[I])));
-                       *(Addr+I) = Val;
-               }
-
-               /*
-                * Check every word within the words
-                * of tested memory
-                */
-
-               for (I = 0U; I < Words; I++) {
-                       /* Read the location */
-                       WordMem32 = *(Addr+I);
-                       Val = (u32) (~((INTPTR) (&Addr[I])));
-
-                       if ((WordMem32 ^ Val) != 0x00000000U) {
-                               Status = -1;
-                               goto End_Label;
-                       }
-               }
-       }
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
-               /*
-                * Generate an initial value for
-                * memory testing
-                */
-
-               if (Pattern == (u32)0) {
-                       Val = 0xDEADBEEFU;
-               }
-               else {
-                       Val = Pattern;
-               }
-
-               /*
-                * Fill the memory with fixed Pattern
-                */
-
-               for (I = 0U; I < Words; I++) {
-                       /* write memory location */
-                       *(Addr+I) = Val;
-               }
-
-               /*
-                * Check every word within the words
-                * of tested memory and compare it
-                * with the fixed Pattern
-                */
-
-               for (I = 0U; I < Words; I++) {
-
-                       /* read memory location */
-
-                       WordMem32 = *(Addr+I);
-                       if (WordMem32 != Val) {
-                               Status = -1;
-                               goto End_Label;
-                       }
-               }
-       }
-
-End_Label:
-       return Status;
-}
-
-/*****************************************************************************/
-/**
-*
-* Perform a destructive 16-bit wide memory test.
-*
-* @param    Addr is a pointer to the region of memory to be tested.
-* @param    Words is the length of the block.
-* @param    Pattern is the constant used for the constant Pattern test, if 0,
-*           0xDEADBEEF is used.
-* @param    Subtest is the test selected. See xil_testmem.h for possible
-*          values.
-*
-* @return
-*
-* - -1 is returned for a failure
-* - 0 is returned for a pass
-*
-* @note
-*
-* Used for spaces where the address range of the region is smaller than
-* the data width. If the memory range is greater than 2 ** Width,
-* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
-* repeat on a boundry of a power of two making it more difficult to detect
-* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
-* tests suffer the same problem. Ideally, if large blocks of memory are to be
-* tested, break them up into smaller regions of memory to allow the test
-* patterns used not to repeat over the region tested.
-*
-*****************************************************************************/
-s32 Xil_TestMem16(u16 *Addr, u32 Words, u16 Pattern, u8 Subtest)
-{
-       u32 I;
-       u32 j;
-       u16 Val;
-       u16 FirtVal;
-       u16 WordMem16;
-       s32 Status = 0;
-
-       Xil_AssertNonvoid(Words != (u32)0);
-       Xil_AssertNonvoid(Subtest <= XIL_TESTMEM_MAXTEST);
-       Xil_AssertNonvoid(Addr != NULL);
-
-       /*
-        * variable initialization
-        */
-       Val = XIL_TESTMEM_INIT_VALUE;
-       FirtVal = XIL_TESTMEM_INIT_VALUE;
-
-       /*
-        * selectthe proper Subtest(s)
-        */
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INCREMENT)) {
-               /*
-                * Fill the memory with incrementing
-                * values starting from 'FirtVal'
-                */
-               for (I = 0U; I < Words; I++) {
-                       /* write memory location */
-                       *(Addr+I) = Val;
-                       Val++;
-               }
-               /*
-                * Restore the reference 'Val' to the
-                * initial value
-                */
-               Val = FirtVal;
-
-               /*
-                * Check every word within the words
-                * of tested memory and compare it
-                * with the incrementing reference val
-                */
-
-               for (I = 0U; I < Words; I++) {
-                       /* read memory location */
-                       WordMem16 = *(Addr+I);
-                       if (WordMem16 != Val) {
-                               Status = -1;
-                               goto End_Label;
-                       }
-                       Val++;
-               }
-       }
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKONES)) {
-               /*
-                * set up to cycle through all possible initial test
-                * Patterns for walking ones test
-                */
-
-               for (j = 0U; j < (u32)16; j++) {
-                       /*
-                        * Generate an initial value for walking ones test
-                        * to test for bad data bits
-                        */
-
-                       Val = (u16)((u32)1 << j);
-                       /*
-                        * START walking ones test
-                        * Write a one to each data bit indifferent locations
-                        */
-
-                       for (I = 0U; I < (u32)16; I++) {
-                               /* write memory location */
-                               *(Addr+I) = Val;
-                               Val = (u16)RotateLeft(Val, 16U);
-                       }
-                       /*
-                        * Restore the reference 'Val' to the
-                        * initial value
-                        */
-                       Val = (u16)((u32)1 << j);
-                       /* Read the values from each location that was written */
-                       for (I = 0U; I < (u32)16; I++) {
-                               /* read memory location */
-                               WordMem16 = *(Addr+I);
-                               if (WordMem16 != Val) {
-                                       Status = -1;
-                                       goto End_Label;
-                               }
-                               Val = (u16)RotateLeft(Val, 16U);
-                       }
-               }
-       }
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKZEROS)) {
-               /*
-                * set up to cycle through all possible initial
-                * test Patterns for walking zeros test
-                */
-
-               for (j = 0U; j < (u32)16; j++) {
-                       /*
-                        * Generate an initial value for walking ones
-                        * test to test for bad
-                        * data bits
-                        */
-
-                       Val = ~(1U << j);
-                       /*
-                        * START walking zeros test
-                        * Write a one to each data bit indifferent locations
-                        */
-
-                       for (I = 0U; I < (u32)16; I++) {
-                               /* write memory location */
-                               *(Addr+I) = Val;
-                               Val = ~((u16)RotateLeft(~Val, 16U));
-                       }
-                       /*
-                        * Restore the reference 'Val' to the
-                        * initial value
-                        */
-                       Val = ~(1U << j);
-                       /* Read the values from each location that was written */
-                       for (I = 0U; I < (u32)16; I++) {
-                               /* read memory location */
-                               WordMem16 = *(Addr+I);
-                               if (WordMem16 != Val) {
-                                       Status = -1;
-                                       goto End_Label;
-                               }
-                               Val = ~((u16)RotateLeft(~Val, 16U));
-                       }
-
-               }
-       }
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INVERSEADDR)) {
-               /* Fill the memory with inverse of address */
-               for (I = 0U; I < Words; I++) {
-                       /* write memory location */
-                       Val = (u16) (~((INTPTR)(&Addr[I])));
-                       *(Addr+I) = Val;
-               }
-               /*
-                * Check every word within the words
-                * of tested memory
-                */
-
-               for (I = 0U; I < Words; I++) {
-                       /* read memory location */
-                       WordMem16 = *(Addr+I);
-                       Val = (u16) (~((INTPTR) (&Addr[I])));
-                       if ((WordMem16 ^ Val) != 0x0000U) {
-                               Status = -1;
-                               goto End_Label;
-                       }
-               }
-       }
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
-               /*
-                * Generate an initial value for
-                * memory testing
-                */
-               if (Pattern == (u16)0) {
-                       Val = 0xDEADU;
-               }
-               else {
-                       Val = Pattern;
-               }
-
-               /*
-                * Fill the memory with fixed pattern
-                */
-
-               for (I = 0U; I < Words; I++) {
-                       /* write memory location */
-                       *(Addr+I) = Val;
-               }
-
-               /*
-                * Check every word within the words
-                * of tested memory and compare it
-                * with the fixed pattern
-                */
-
-               for (I = 0U; I < Words; I++) {
-                       /* read memory location */
-                       WordMem16 = *(Addr+I);
-                       if (WordMem16 != Val) {
-                               Status = -1;
-                               goto End_Label;
-                       }
-               }
-       }
-
-End_Label:
-       return Status;
-}
-
-
-/*****************************************************************************/
-/**
-*
-* Perform a destructive 8-bit wide memory test.
-*
-* @param    Addr is a pointer to the region of memory to be tested.
-* @param    Words is the length of the block.
-* @param    Pattern is the constant used for the constant pattern test, if 0,
-*           0xDEADBEEF is used.
-* @param    Subtest is the test selected. See xil_testmem.h for possible
-*          values.
-*
-* @return
-*
-* - -1 is returned for a failure
-* - 0 is returned for a pass
-*
-* @note
-*
-* Used for spaces where the address range of the region is smaller than
-* the data width. If the memory range is greater than 2 ** Width,
-* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
-* repeat on a boundry of a power of two making it more difficult to detect
-* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
-* tests suffer the same problem. Ideally, if large blocks of memory are to be
-* tested, break them up into smaller regions of memory to allow the test
-* patterns used not to repeat over the region tested.
-*
-*****************************************************************************/
-s32 Xil_TestMem8(u8 *Addr, u32 Words, u8 Pattern, u8 Subtest)
-{
-       u32 I;
-       u32 j;
-       u8 Val;
-       u8 FirtVal;
-       u8 WordMem8;
-       s32 Status = 0;
-
-       Xil_AssertNonvoid(Words != (u32)0);
-       Xil_AssertNonvoid(Subtest <= XIL_TESTMEM_MAXTEST);
-       Xil_AssertNonvoid(Addr != NULL);
-
-       /*
-        * variable initialization
-        */
-       Val = XIL_TESTMEM_INIT_VALUE;
-       FirtVal = XIL_TESTMEM_INIT_VALUE;
-
-       /*
-        * select the proper Subtest(s)
-        */
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INCREMENT)) {
-               /*
-                * Fill the memory with incrementing
-                * values starting from 'FirtVal'
-                */
-               for (I = 0U; I < Words; I++) {
-                       /* write memory location */
-                       *(Addr+I) = Val;
-                       Val++;
-               }
-               /*
-                * Restore the reference 'Val' to the
-                * initial value
-                */
-               Val = FirtVal;
-               /*
-                * Check every word within the words
-                * of tested memory and compare it
-                * with the incrementing reference
-                * Val
-                */
-
-               for (I = 0U; I < Words; I++) {
-                       /* read memory location */
-                       WordMem8 = *(Addr+I);
-                       if (WordMem8 != Val) {
-                               Status = -1;
-                               goto End_Label;
-                       }
-                       Val++;
-               }
-       }
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKONES)) {
-               /*
-                * set up to cycle through all possible initial
-                * test Patterns for walking ones test
-                */
-
-               for (j = 0U; j < (u32)8; j++) {
-                       /*
-                        * Generate an initial value for walking ones test
-                        * to test for bad data bits
-                        */
-                       Val = (u8)((u32)1 << j);
-                       /*
-                        * START walking ones test
-                        * Write a one to each data bit indifferent locations
-                        */
-                       for (I = 0U; I < (u32)8; I++) {
-                               /* write memory location */
-                               *(Addr+I) = Val;
-                               Val = (u8)RotateLeft(Val, 8U);
-                       }
-                       /*
-                        * Restore the reference 'Val' to the
-                        * initial value
-                        */
-                       Val = (u8)((u32)1 << j);
-                       /* Read the values from each location that was written */
-                       for (I = 0U; I < (u32)8; I++) {
-                               /* read memory location */
-                               WordMem8 = *(Addr+I);
-                               if (WordMem8 != Val) {
-                                       Status = -1;
-                                       goto End_Label;
-                               }
-                               Val = (u8)RotateLeft(Val, 8U);
-                       }
-               }
-       }
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_WALKZEROS)) {
-               /*
-                * set up to cycle through all possible initial test
-                * Patterns for walking zeros test
-                */
-
-               for (j = 0U; j < (u32)8; j++) {
-                       /*
-                        * Generate an initial value for walking ones test to test
-                        * for bad data bits
-                        */
-                       Val = ~(1U << j);
-                       /*
-                        * START walking zeros test
-                        * Write a one to each data bit indifferent locations
-                        */
-                       for (I = 0U; I < (u32)8; I++) {
-                               /* write memory location */
-                               *(Addr+I) = Val;
-                               Val = ~((u8)RotateLeft(~Val, 8U));
-                       }
-                       /*
-                        * Restore the reference 'Val' to the
-                        * initial value
-                        */
-                       Val = ~(1U << j);
-                       /* Read the values from each location that was written */
-                       for (I = 0U; I < (u32)8; I++) {
-                               /* read memory location */
-                               WordMem8 = *(Addr+I);
-                               if (WordMem8 != Val) {
-                                       Status = -1;
-                                       goto End_Label;
-                               }
-
-                               Val = ~((u8)RotateLeft(~Val, 8U));
-                       }
-               }
-       }
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_INVERSEADDR)) {
-               /* Fill the memory with inverse of address */
-               for (I = 0U; I < Words; I++) {
-                       /* write memory location */
-                       Val = (u8) (~((INTPTR) (&Addr[I])));
-                       *(Addr+I) = Val;
-               }
-
-               /*
-                * Check every word within the words
-                * of tested memory
-                */
-
-               for (I = 0U; I < Words; I++) {
-                       /* read memory location */
-                       WordMem8 = *(Addr+I);
-                       Val = (u8) (~((INTPTR) (&Addr[I])));
-                       if ((WordMem8 ^ Val) != 0x00U) {
-                               Status = -1;
-                               goto End_Label;
-                       }
-               }
-       }
-
-       if((Subtest == XIL_TESTMEM_ALLMEMTESTS) || (Subtest == XIL_TESTMEM_FIXEDPATTERN)) {
-               /*
-                * Generate an initial value for
-                * memory testing
-                */
-
-               if (Pattern == (u8)0) {
-                       Val = 0xA5U;
-               }
-               else {
-                       Val = Pattern;
-               }
-               /*
-                * Fill the memory with fixed Pattern
-                */
-               for (I = 0U; I < Words; I++) {
-                       /* write memory location */
-                       *(Addr+I) = Val;
-               }
-               /*
-                * Check every word within the words
-                * of tested memory and compare it
-                * with the fixed Pattern
-                */
-
-               for (I = 0U; I < Words; I++) {
-                       /* read memory location */
-                       WordMem8 = *(Addr+I);
-                       if (WordMem8 != Val) {
-                               Status = -1;
-                               goto End_Label;
-                       }
-               }
-       }
-
-End_Label:
-       return Status;
-}
-
-
-/*****************************************************************************/
-/**
-*
-* Rotates the provided value to the left one bit position
-*
-* @param    Input is value to be rotated to the left
-* @param    Width is the number of bits in the input data
-*
-* @return
-*
-* The resulting unsigned long value of the rotate left
-*
-* @note
-*
-* None.
-*
-*****************************************************************************/
-static u32 RotateLeft(u32 Input, u8 Width)
-{
-       u32 Msb;
-       u32 ReturnVal;
-       u32 WidthMask;
-       u32 MsbMask;
-       u32 LocalInput = Input;
-
-       /*
-        * set up the WidthMask and the MsbMask
-        */
-
-       MsbMask = 1U << (Width - 1U);
-
-       WidthMask = (MsbMask << (u32)1) - (u32)1;
-
-       /*
-        * set the Width of the Input to the correct width
-        */
-
-       LocalInput = LocalInput & WidthMask;
-
-       Msb = LocalInput & MsbMask;
-
-       ReturnVal = LocalInput << 1U;
-
-       if (Msb != 0x00000000U) {
-               ReturnVal = ReturnVal | (u32)0x00000001;
-       }
-
-       ReturnVal = ReturnVal & WidthMask;
-
-       return ReturnVal;
-
-}
-
-#ifdef ROTATE_RIGHT
-/*****************************************************************************/
-/**
-*
-* Rotates the provided value to the right one bit position
-*
-* @param    Input is value to be rotated to the right
-* @param    Width is the number of bits in the input data
-*
-* @return
-*
-* The resulting u32 value of the rotate right
-*
-* @note
-*
-* None.
-*
-*****************************************************************************/
-static u32 RotateRight(u32 Input, u8 Width)
-{
-       u32 Lsb;
-       u32 ReturnVal;
-       u32 WidthMask;
-       u32 MsbMask;
-       u32 LocalInput = Input;
-       /*
-        * set up the WidthMask and the MsbMask
-        */
-
-       MsbMask = 1U << (Width - 1U);
-
-       WidthMask = (MsbMask << 1U) - 1U;
-
-       /*
-        * set the width of the input to the correct width
-        */
-
-       LocalInput = LocalInput & WidthMask;
-
-       ReturnVal = LocalInput >> 1U;
-
-       Lsb = LocalInput & 0x00000001U;
-
-       if (Lsb != 0x00000000U) {
-               ReturnVal = ReturnVal | MsbMask;
-       }
-
-       ReturnVal = ReturnVal & WidthMask;
-
-       return ReturnVal;
-
-}
-#endif /* ROTATE_RIGHT */