*
* Bad Block Table support for the OneNAND driver
*
- * Copyright(c) 2005-2007 Samsung Electronics
+ * Copyright(c) 2005-2008 Samsung Electronics
* Kyungmin Park <kyungmin.park@samsung.com>
*
* TODO:
* @param buf temporary buffer
* @param bd descriptor for the good/bad block search pattern
* @param chip create the table for a specific chip, -1 read all chips.
- * Applies only if NAND_BBT_PERCHIP option is set
+ * Applies only if NAND_BBT_PERCHIP option is set
*
* Create a bad block table by scanning the device
* for the given good/bad block identify pattern
res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03;
MTDDEBUG (MTD_DEBUG_LEVEL2,
- "onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n",
- (unsigned int)offs, block >> 1, res);
+ "onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n",
+ (unsigned int)offs, block >> 1, res);
switch ((int)res) {
case 0x00: