From c48cb7ebfb42d997a3f4317a412992f403c717aa Mon Sep 17 00:00:00 2001 From: Przemyslaw Marczak Date: Tue, 27 Oct 2015 13:08:07 +0100 Subject: [PATCH] sandbox: add ADC unit tests This commit adds unit tests for ADC uclass's methods using sandbox ADC. Testing proper ADC binding: - dm_test_adc_bind() - device binding - dm_test_adc_wrong_channel_selection() - checking wrong channel selection Testing ADC supply operations: - dm_test_adc_supply(): - Vdd/Vss values validating - Vdd regulator updated value validating - Vdd regulator's auto enable state validating Testing ADC operations results: - dm_test_adc_single_channel_conversion() - single channel start/data - dm_test_adc_single_channel_shot() - single channel shot - dm_test_adc_multi_channel_conversion() - multi channel start/data - dm_test_adc_multi_channel_shot() - multi channel single shot Signed-off-by: Przemyslaw Marczak Cc: Simon Glass Signed-off-by: Minkyu Kang --- include/power/sandbox_pmic.h | 4 + test/dm/Makefile | 1 + test/dm/adc.c | 165 +++++++++++++++++++++++++++++++++++ 3 files changed, 170 insertions(+) create mode 100644 test/dm/adc.c diff --git a/include/power/sandbox_pmic.h b/include/power/sandbox_pmic.h index 8547674971..7fdbfb9fc6 100644 --- a/include/power/sandbox_pmic.h +++ b/include/power/sandbox_pmic.h @@ -126,6 +126,10 @@ enum { #define SANDBOX_BUCK1_AUTOSET_EXPECTED_UA 200000 #define SANDBOX_BUCK1_AUTOSET_EXPECTED_ENABLE true +/* BUCK2: for testing sandbox ADC's supply */ +#define SANDBOX_BUCK2_INITIAL_EXPECTED_UV 3000000 +#define SANDBOX_BUCK2_SET_UV 3300000 + /* LDO1/2 for testing regulator_list_autoset() */ #define SANDBOX_LDO1_AUTOSET_EXPECTED_UV 1800000 #define SANDBOX_LDO1_AUTOSET_EXPECTED_UA 100000 diff --git a/test/dm/Makefile b/test/dm/Makefile index 7b3626cb32..39630f68c8 100644 --- a/test/dm/Makefile +++ b/test/dm/Makefile @@ -33,4 +33,5 @@ obj-y += syscon.o obj-$(CONFIG_DM_USB) += usb.o obj-$(CONFIG_DM_PMIC) += pmic.o obj-$(CONFIG_DM_REGULATOR) += regulator.o +obj-$(CONFIG_ADC) += adc.o endif diff --git a/test/dm/adc.c b/test/dm/adc.c new file mode 100644 index 0000000000..b0d4fe5b23 --- /dev/null +++ b/test/dm/adc.c @@ -0,0 +1,165 @@ +/* + * Tests for the driver model ADC API + * + * Copyright (c) 2015 Samsung Electronics + * Przemyslaw Marczak + * + * SPDX-License-Identifier: GPL-2.0+ + */ + +#include +#include +#include +#include +#include +#include +#include +#include +#include +#include +#include +#include + +DECLARE_GLOBAL_DATA_PTR; + +static int dm_test_adc_bind(struct unit_test_state *uts) +{ + struct udevice *dev; + + ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev)); + ut_asserteq_str(SANDBOX_ADC_DEVNAME, dev->name); + + return 0; +} +DM_TEST(dm_test_adc_bind, DM_TESTF_SCAN_FDT); + +static int dm_test_adc_wrong_channel_selection(struct unit_test_state *uts) +{ + struct udevice *dev; + + ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev)); + ut_asserteq(-EINVAL, adc_start_channel(dev, SANDBOX_ADC_CHANNELS)); + + return 0; +} +DM_TEST(dm_test_adc_wrong_channel_selection, DM_TESTF_SCAN_FDT); + +static int dm_test_adc_supply(struct unit_test_state *uts) +{ + struct udevice *supply; + struct udevice *dev; + int uV; + + ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev)); + + /* Test Vss value - predefined 0 uV */ + ut_assertok(adc_vss_value(dev, &uV)); + ut_asserteq(SANDBOX_ADC_VSS_VALUE, uV); + + /* Test Vdd initial value - buck2 */ + ut_assertok(adc_vdd_value(dev, &uV)); + ut_asserteq(SANDBOX_BUCK2_INITIAL_EXPECTED_UV, uV); + + /* Change Vdd value - buck2 manual preset */ + ut_assertok(regulator_get_by_devname(SANDBOX_BUCK2_DEVNAME, &supply)); + ut_assertok(regulator_set_value(supply, SANDBOX_BUCK2_SET_UV)); + ut_asserteq(SANDBOX_BUCK2_SET_UV, regulator_get_value(supply)); + + /* Update ADC platdata and get new Vdd value */ + ut_assertok(adc_vdd_value(dev, &uV)); + ut_asserteq(SANDBOX_BUCK2_SET_UV, uV); + + /* Disable buck2 and test ADC supply enable function */ + ut_assertok(regulator_set_enable(supply, false)); + ut_asserteq(false, regulator_get_enable(supply)); + /* adc_start_channel() should enable the supply regulator */ + ut_assertok(adc_start_channel(dev, 0)); + ut_asserteq(true, regulator_get_enable(supply)); + + return 0; +} +DM_TEST(dm_test_adc_supply, DM_TESTF_SCAN_FDT); + +struct adc_channel adc_channel_test_data[] = { + { 0, SANDBOX_ADC_CHANNEL0_DATA }, + { 1, SANDBOX_ADC_CHANNEL1_DATA }, + { 2, SANDBOX_ADC_CHANNEL2_DATA }, + { 3, SANDBOX_ADC_CHANNEL3_DATA }, +}; + +static int dm_test_adc_single_channel_conversion(struct unit_test_state *uts) +{ + struct adc_channel *tdata = adc_channel_test_data; + unsigned int i, data; + struct udevice *dev; + + ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev)); + /* Test each ADC channel's value */ + for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) { + ut_assertok(adc_start_channel(dev, tdata->id)); + ut_assertok(adc_channel_data(dev, tdata->id, &data)); + ut_asserteq(tdata->data, data); + } + + return 0; +} +DM_TEST(dm_test_adc_single_channel_conversion, DM_TESTF_SCAN_FDT); + +static int dm_test_adc_multi_channel_conversion(struct unit_test_state *uts) +{ + struct adc_channel channels[SANDBOX_ADC_CHANNELS]; + struct udevice *dev; + struct adc_channel *tdata = adc_channel_test_data; + unsigned int i, channel_mask; + + channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) | + ADC_CHANNEL(2) | ADC_CHANNEL(3); + + /* Start multi channel conversion */ + ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev)); + ut_assertok(adc_start_channels(dev, channel_mask)); + ut_assertok(adc_channels_data(dev, channel_mask, channels)); + + /* Compare the expected and returned conversion data. */ + for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) + ut_asserteq(tdata->data, channels[i].data); + + return 0; +} +DM_TEST(dm_test_adc_multi_channel_conversion, DM_TESTF_SCAN_FDT); + +static int dm_test_adc_single_channel_shot(struct unit_test_state *uts) +{ + struct adc_channel *tdata = adc_channel_test_data; + unsigned int i, data; + + for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) { + /* Start single channel conversion */ + ut_assertok(adc_channel_single_shot("adc", tdata->id, &data)); + /* Compare the expected and returned conversion data. */ + ut_asserteq(tdata->data, data); + } + + return 0; +} +DM_TEST(dm_test_adc_single_channel_shot, DM_TESTF_SCAN_FDT); + +static int dm_test_adc_multi_channel_shot(struct unit_test_state *uts) +{ + struct adc_channel channels[SANDBOX_ADC_CHANNELS]; + struct adc_channel *tdata = adc_channel_test_data; + unsigned int i, channel_mask; + + channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) | + ADC_CHANNEL(2) | ADC_CHANNEL(3); + + /* Start single call and multi channel conversion */ + ut_assertok(adc_channels_single_shot("adc", channel_mask, channels)); + + /* Compare the expected and returned conversion data. */ + for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) + ut_asserteq(tdata->data, channels[i].data); + + return 0; +} +DM_TEST(dm_test_adc_multi_channel_shot, DM_TESTF_SCAN_FDT); -- 2.39.5