+++ /dev/null
-/******************************************************************************
-*
-* Copyright (C) 2009 - 2015 Xilinx, Inc. All rights reserved.
-*
-* Permission is hereby granted, free of charge, to any person obtaining a copy
-* of this software and associated documentation files (the "Software"), to deal
-* in the Software without restriction, including without limitation the rights
-* to use, copy, modify, merge, publish, distribute, sublicense, and/or sell
-* copies of the Software, and to permit persons to whom the Software is
-* furnished to do so, subject to the following conditions:
-*
-* The above copyright notice and this permission notice shall be included in
-* all copies or substantial portions of the Software.
-*
-* Use of the Software is limited solely to applications:
-* (a) running on a Xilinx device, or
-* (b) that interact with a Xilinx device through a bus or interconnect.
-*
-* THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
-* IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
-* FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL
-* XILINX BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY,
-* WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF
-* OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE
-* SOFTWARE.
-*
-* Except as contained in this notice, the name of the Xilinx shall not be used
-* in advertising or otherwise to promote the sale, use or other dealings in
-* this Software without prior written authorization from Xilinx.
-*
-******************************************************************************/
-/*****************************************************************************/
-/**
-*
-* @file xil_testmem.h
-*
-* This file contains utility functions to test memory.
-*
-* <b>Memory test description</b>
-*
-* A subset of the memory tests can be selected or all of the tests can be run
-* in order. If there is an error detected by a subtest, the test stops and the
-* failure code is returned. Further tests are not run even if all of the tests
-* are selected.
-*
-* Subtest descriptions:
-* <pre>
-* XIL_TESTMEM_ALLMEMTESTS:
-* Runs all of the following tests
-*
-* XIL_TESTMEM_INCREMENT:
-* Incrementing Value Test.
-* This test starts at 'XIL_TESTMEM_INIT_VALUE' and uses the
-* incrementing value as the test value for memory.
-*
-* XIL_TESTMEM_WALKONES:
-* Walking Ones Test.
-* This test uses a walking '1' as the test value for memory.
-* location 1 = 0x00000001
-* location 2 = 0x00000002
-* ...
-*
-* XIL_TESTMEM_WALKZEROS:
-* Walking Zero's Test.
-* This test uses the inverse value of the walking ones test
-* as the test value for memory.
-* location 1 = 0xFFFFFFFE
-* location 2 = 0xFFFFFFFD
-* ...
-*
-* XIL_TESTMEM_INVERSEADDR:
-* Inverse Address Test.
-* This test uses the inverse of the address of the location under test
-* as the test value for memory.
-*
-* XIL_TESTMEM_FIXEDPATTERN:
-* Fixed Pattern Test.
-* This test uses the provided patters as the test value for memory.
-* If zero is provided as the pattern the test uses '0xDEADBEEF".
-* </pre>
-*
-* <i>WARNING</i>
-*
-* The tests are <b>DESTRUCTIVE</b>. Run before any initialized memory spaces
-* have been set up.
-*
-* The address provided to the memory tests is not checked for
-* validity except for the NULL case. It is possible to provide a code-space
-* pointer for this test to start with and ultimately destroy executable code
-* causing random failures.
-*
-* @note
-*
-* Used for spaces where the address range of the region is smaller than
-* the data width. If the memory range is greater than 2 ** width,
-* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
-* repeat on a boundry of a power of two making it more difficult to detect
-* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
-* tests suffer the same problem. Ideally, if large blocks of memory are to be
-* tested, break them up into smaller regions of memory to allow the test
-* patterns used not to repeat over the region tested.
-*
-* <pre>
-* MODIFICATION HISTORY:
-*
-* Ver Who Date Changes
-* ----- ---- -------- -----------------------------------------------
-* 1.00a hbm 08/25/09 First release
-* </pre>
-*
-******************************************************************************/
-
-#ifndef XIL_TESTMEM_H /* prevent circular inclusions */
-#define XIL_TESTMEM_H /* by using protection macros */
-
-#ifdef __cplusplus
-extern "C" {
-#endif
-
-/***************************** Include Files *********************************/
-#include "xil_types.h"
-
-/************************** Constant Definitions *****************************/
-
-
-/**************************** Type Definitions *******************************/
-
-/* xutil_memtest defines */
-
-#define XIL_TESTMEM_INIT_VALUE 1U
-
-/** @name Memory subtests
- * @{
- */
-/**
- * See the detailed description of the subtests in the file description.
- */
-#define XIL_TESTMEM_ALLMEMTESTS 0x00U
-#define XIL_TESTMEM_INCREMENT 0x01U
-#define XIL_TESTMEM_WALKONES 0x02U
-#define XIL_TESTMEM_WALKZEROS 0x03U
-#define XIL_TESTMEM_INVERSEADDR 0x04U
-#define XIL_TESTMEM_FIXEDPATTERN 0x05U
-#define XIL_TESTMEM_MAXTEST XIL_TESTMEM_FIXEDPATTERN
-/* @} */
-
-/***************** Macros (Inline Functions) Definitions *********************/
-
-
-/************************** Function Prototypes ******************************/
-
-/* xutil_testmem prototypes */
-
-extern s32 Xil_TestMem32(u32 *Addr, u32 Words, u32 Pattern, u8 Subtest);
-extern s32 Xil_TestMem16(u16 *Addr, u32 Words, u16 Pattern, u8 Subtest);
-extern s32 Xil_TestMem8(u8 *Addr, u32 Words, u8 Pattern, u8 Subtest);
-
-#ifdef __cplusplus
-}
-#endif
-
-#endif /* end of protection macro */
projects / freertos / blobdiff