--- /dev/null
+/******************************************************************************
+*
+* Copyright (C) 2009 - 2015 Xilinx, Inc. All rights reserved.
+*
+* Permission is hereby granted, free of charge, to any person obtaining a copy
+* of this software and associated documentation files (the "Software"), to deal
+* in the Software without restriction, including without limitation the rights
+* to use, copy, modify, merge, publish, distribute, sublicense, and/or sell
+* copies of the Software, and to permit persons to whom the Software is
+* furnished to do so, subject to the following conditions:
+*
+* The above copyright notice and this permission notice shall be included in
+* all copies or substantial portions of the Software.
+*
+* Use of the Software is limited solely to applications:
+* (a) running on a Xilinx device, or
+* (b) that interact with a Xilinx device through a bus or interconnect.
+*
+* THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
+* IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
+* FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL
+* XILINX BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY,
+* WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF
+* OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE
+* SOFTWARE.
+*
+* Except as contained in this notice, the name of the Xilinx shall not be used
+* in advertising or otherwise to promote the sale, use or other dealings in
+* this Software without prior written authorization from Xilinx.
+*
+******************************************************************************/
+/*****************************************************************************/
+/**
+*
+* @file xil_testmem.h
+*
+* This file contains utility functions to test memory.
+*
+* <b>Memory test description</b>
+*
+* A subset of the memory tests can be selected or all of the tests can be run
+* in order. If there is an error detected by a subtest, the test stops and the
+* failure code is returned. Further tests are not run even if all of the tests
+* are selected.
+*
+* Subtest descriptions:
+* <pre>
+* XIL_TESTMEM_ALLMEMTESTS:
+* Runs all of the following tests
+*
+* XIL_TESTMEM_INCREMENT:
+* Incrementing Value Test.
+* This test starts at 'XIL_TESTMEM_INIT_VALUE' and uses the
+* incrementing value as the test value for memory.
+*
+* XIL_TESTMEM_WALKONES:
+* Walking Ones Test.
+* This test uses a walking '1' as the test value for memory.
+* location 1 = 0x00000001
+* location 2 = 0x00000002
+* ...
+*
+* XIL_TESTMEM_WALKZEROS:
+* Walking Zero's Test.
+* This test uses the inverse value of the walking ones test
+* as the test value for memory.
+* location 1 = 0xFFFFFFFE
+* location 2 = 0xFFFFFFFD
+* ...
+*
+* XIL_TESTMEM_INVERSEADDR:
+* Inverse Address Test.
+* This test uses the inverse of the address of the location under test
+* as the test value for memory.
+*
+* XIL_TESTMEM_FIXEDPATTERN:
+* Fixed Pattern Test.
+* This test uses the provided patters as the test value for memory.
+* If zero is provided as the pattern the test uses '0xDEADBEEF".
+* </pre>
+*
+* <i>WARNING</i>
+*
+* The tests are <b>DESTRUCTIVE</b>. Run before any initialized memory spaces
+* have been set up.
+*
+* The address provided to the memory tests is not checked for
+* validity except for the NULL case. It is possible to provide a code-space
+* pointer for this test to start with and ultimately destroy executable code
+* causing random failures.
+*
+* @note
+*
+* Used for spaces where the address range of the region is smaller than
+* the data width. If the memory range is greater than 2 ** width,
+* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
+* repeat on a boundry of a power of two making it more difficult to detect
+* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
+* tests suffer the same problem. Ideally, if large blocks of memory are to be
+* tested, break them up into smaller regions of memory to allow the test
+* patterns used not to repeat over the region tested.
+*
+* <pre>
+* MODIFICATION HISTORY:
+*
+* Ver Who Date Changes
+* ----- ---- -------- -----------------------------------------------
+* 1.00a hbm 08/25/09 First release
+* </pre>
+*
+******************************************************************************/
+
+#ifndef XIL_TESTMEM_H /* prevent circular inclusions */
+#define XIL_TESTMEM_H /* by using protection macros */
+
+#ifdef __cplusplus
+extern "C" {
+#endif
+
+/***************************** Include Files *********************************/
+#include "xil_types.h"
+
+/************************** Constant Definitions *****************************/
+
+
+/**************************** Type Definitions *******************************/
+
+/* xutil_memtest defines */
+
+#define XIL_TESTMEM_INIT_VALUE 1U
+
+/** @name Memory subtests
+ * @{
+ */
+/**
+ * See the detailed description of the subtests in the file description.
+ */
+#define XIL_TESTMEM_ALLMEMTESTS 0x00U
+#define XIL_TESTMEM_INCREMENT 0x01U
+#define XIL_TESTMEM_WALKONES 0x02U
+#define XIL_TESTMEM_WALKZEROS 0x03U
+#define XIL_TESTMEM_INVERSEADDR 0x04U
+#define XIL_TESTMEM_FIXEDPATTERN 0x05U
+#define XIL_TESTMEM_MAXTEST XIL_TESTMEM_FIXEDPATTERN
+/* @} */
+
+/***************** Macros (Inline Functions) Definitions *********************/
+
+
+/************************** Function Prototypes ******************************/
+
+/* xutil_testmem prototypes */
+
+extern s32 Xil_TestMem32(u32 *Addr, u32 Words, u32 Pattern, u8 Subtest);
+extern s32 Xil_TestMem16(u16 *Addr, u32 Words, u16 Pattern, u8 Subtest);
+extern s32 Xil_TestMem8(u8 *Addr, u32 Words, u8 Pattern, u8 Subtest);
+
+#ifdef __cplusplus
+}
+#endif
+
+#endif /* end of protection macro */
projects / freertos / blobdiff