--- /dev/null
+/******************************************************************************
+*
+* Copyright (C) 2009 - 2015 Xilinx, Inc. All rights reserved.
+*
+* Permission is hereby granted, free of charge, to any person obtaining a copy
+* of this software and associated documentation files (the "Software"), to deal
+* in the Software without restriction, including without limitation the rights
+* to use, copy, modify, merge, publish, distribute, sublicense, and/or sell
+* copies of the Software, and to permit persons to whom the Software is
+* furnished to do so, subject to the following conditions:
+*
+* The above copyright notice and this permission notice shall be included in
+* all copies or substantial portions of the Software.
+*
+* Use of the Software is limited solely to applications:
+* (a) running on a Xilinx device, or
+* (b) that interact with a Xilinx device through a bus or interconnect.
+*
+* THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
+* IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
+* FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL
+* XILINX BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY,
+* WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF
+* OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE
+* SOFTWARE.
+*
+* Except as contained in this notice, the name of the Xilinx shall not be used
+* in advertising or otherwise to promote the sale, use or other dealings in
+* this Software without prior written authorization from Xilinx.
+*
+******************************************************************************/
+/*****************************************************************************/
+/**
+*
+* @file xil_testio.c
+*
+* Contains the memory test utility functions.
+*
+* <pre>
+* MODIFICATION HISTORY:
+*
+* Ver Who Date Changes
+* ----- ---- -------- -----------------------------------------------
+* 1.00a hbm 08/25/09 First release
+* </pre>
+*
+*****************************************************************************/
+
+/***************************** Include Files ********************************/
+#include "xil_testio.h"
+#include "xil_assert.h"
+#include "xil_io.h"
+
+/************************** Constant Definitions ****************************/
+/************************** Function Prototypes *****************************/
+
+
+
+/**
+ *
+ * Endian swap a 16-bit word.
+ * @param Data is the 16-bit word to be swapped.
+ * @return The endian swapped value.
+ *
+ */
+static u16 Swap16(u16 Data)
+{
+ return ((Data >> 8U) & 0x00FFU) | ((Data << 8U) & 0xFF00U);
+}
+
+/**
+ *
+ * Endian swap a 32-bit word.
+ * @param Data is the 32-bit word to be swapped.
+ * @return The endian swapped value.
+ *
+ */
+static u32 Swap32(u32 Data)
+{
+ u16 Lo16;
+ u16 Hi16;
+
+ u16 Swap16Lo;
+ u16 Swap16Hi;
+
+ Hi16 = (u16)((Data >> 16U) & 0x0000FFFFU);
+ Lo16 = (u16)(Data & 0x0000FFFFU);
+
+ Swap16Lo = Swap16(Lo16);
+ Swap16Hi = Swap16(Hi16);
+
+ return (((u32)(Swap16Lo)) << 16U) | ((u32)Swap16Hi);
+}
+
+/*****************************************************************************/
+/**
+*
+* @brief Perform a destructive 8-bit wide register IO test where the
+* register is accessed using Xil_Out8 and Xil_In8, and comparing
+* the written values by reading them back.
+*
+* @param Addr: a pointer to the region of memory to be tested.
+* @param Length: Length of the block.
+* @param Value: constant used for writting the memory.
+*
+* @return
+* - -1 is returned for a failure
+* - 0 is returned for a pass
+*
+*****************************************************************************/
+
+s32 Xil_TestIO8(u8 *Addr, s32 Length, u8 Value)
+{
+ u8 ValueIn;
+ s32 Index;
+ s32 Status = 0;
+
+ for (Index = 0; Index < Length; Index++) {
+ Xil_Out8((INTPTR)Addr, Value);
+
+ ValueIn = Xil_In8((INTPTR)Addr);
+
+ if ((Value != ValueIn) && (Status == 0)) {
+ Status = -1;
+ break;
+ }
+ }
+ return Status;
+
+}
+
+/*****************************************************************************/
+/**
+*
+* @brief Perform a destructive 16-bit wide register IO test. Each location
+* is tested by sequentially writing a 16-bit wide register, reading
+* the register, and comparing value. This function tests three kinds
+* of register IO functions, normal register IO, little-endian register
+* IO, and big-endian register IO. When testing little/big-endian IO,
+* the function performs the following sequence, Xil_Out16LE/Xil_Out16BE,
+* Xil_In16, Compare In-Out values, Xil_Out16, Xil_In16LE/Xil_In16BE,
+* Compare In-Out values. Whether to swap the read-in value before
+* comparing is controlled by the 5th argument.
+*
+* @param Addr: a pointer to the region of memory to be tested.
+* @param Length: Length of the block.
+* @param Value: constant used for writting the memory.
+* @param Kind: Type of test. Acceptable values are:
+* XIL_TESTIO_DEFAULT, XIL_TESTIO_LE, XIL_TESTIO_BE.
+* @param Swap: indicates whether to byte swap the read-in value.
+*
+* @return
+* - -1 is returned for a failure
+* - 0 is returned for a pass
+*
+*****************************************************************************/
+
+s32 Xil_TestIO16(u16 *Addr, s32 Length, u16 Value, s32 Kind, s32 Swap)
+{
+ u16 *TempAddr16;
+ u16 ValueIn = 0U;
+ s32 Index;
+ TempAddr16 = Addr;
+ Xil_AssertNonvoid(TempAddr16 != NULL);
+
+ for (Index = 0; Index < Length; Index++) {
+ switch (Kind) {
+ case XIL_TESTIO_LE:
+ Xil_Out16LE((INTPTR)TempAddr16, Value);
+ break;
+ case XIL_TESTIO_BE:
+ Xil_Out16BE((INTPTR)TempAddr16, Value);
+ break;
+ default:
+ Xil_Out16((INTPTR)TempAddr16, Value);
+ break;
+ }
+
+ ValueIn = Xil_In16((INTPTR)TempAddr16);
+
+ if ((Kind != 0) && (Swap != 0)) {
+ ValueIn = Swap16(ValueIn);
+ }
+
+ if (Value != ValueIn) {
+ return -1;
+ }
+
+ /* second round */
+ Xil_Out16((INTPTR)TempAddr16, Value);
+
+ switch (Kind) {
+ case XIL_TESTIO_LE:
+ ValueIn = Xil_In16LE((INTPTR)TempAddr16);
+ break;
+ case XIL_TESTIO_BE:
+ ValueIn = Xil_In16BE((INTPTR)TempAddr16);
+ break;
+ default:
+ ValueIn = Xil_In16((INTPTR)TempAddr16);
+ break;
+ }
+
+
+ if ((Kind != 0) && (Swap != 0)) {
+ ValueIn = Swap16(ValueIn);
+ }
+
+ if (Value != ValueIn) {
+ return -1;
+ }
+ TempAddr16 += sizeof(u16);
+ }
+ return 0;
+}
+
+
+/*****************************************************************************/
+/**
+*
+* @brief Perform a destructive 32-bit wide register IO test. Each location
+* is tested by sequentially writing a 32-bit wide regsiter, reading
+* the register, and comparing value. This function tests three kinds
+* of register IO functions, normal register IO, little-endian register IO,
+* and big-endian register IO. When testing little/big-endian IO,
+* the function perform the following sequence, Xil_Out32LE/
+* Xil_Out32BE, Xil_In32, Compare, Xil_Out32, Xil_In32LE/Xil_In32BE, Compare.
+* Whether to swap the read-in value *before comparing is controlled
+* by the 5th argument.
+* @param Addr: a pointer to the region of memory to be tested.
+* @param Length: Length of the block.
+* @param Value: constant used for writting the memory.
+* @param Kind: type of test. Acceptable values are:
+* XIL_TESTIO_DEFAULT, XIL_TESTIO_LE, XIL_TESTIO_BE.
+* @param Swap: indicates whether to byte swap the read-in value.
+*
+* @return
+* - -1 is returned for a failure
+* - 0 is returned for a pass
+*
+*****************************************************************************/
+s32 Xil_TestIO32(u32 *Addr, s32 Length, u32 Value, s32 Kind, s32 Swap)
+{
+ u32 *TempAddr;
+ u32 ValueIn = 0U;
+ s32 Index;
+ TempAddr = Addr;
+ Xil_AssertNonvoid(TempAddr != NULL);
+
+ for (Index = 0; Index < Length; Index++) {
+ switch (Kind) {
+ case XIL_TESTIO_LE:
+ Xil_Out32LE((INTPTR)TempAddr, Value);
+ break;
+ case XIL_TESTIO_BE:
+ Xil_Out32BE((INTPTR)TempAddr, Value);
+ break;
+ default:
+ Xil_Out32((INTPTR)TempAddr, Value);
+ break;
+ }
+
+ ValueIn = Xil_In32((INTPTR)TempAddr);
+
+ if ((Kind != 0) && (Swap != 0)) {
+ ValueIn = Swap32(ValueIn);
+ }
+
+ if (Value != ValueIn) {
+ return -1;
+ }
+
+ /* second round */
+ Xil_Out32((INTPTR)TempAddr, Value);
+
+
+ switch (Kind) {
+ case XIL_TESTIO_LE:
+ ValueIn = Xil_In32LE((INTPTR)TempAddr);
+ break;
+ case XIL_TESTIO_BE:
+ ValueIn = Xil_In32BE((INTPTR)TempAddr);
+ break;
+ default:
+ ValueIn = Xil_In32((INTPTR)TempAddr);
+ break;
+ }
+
+ if ((Kind != 0) && (Swap != 0)) {
+ ValueIn = Swap32(ValueIn);
+ }
+
+ if (Value != ValueIn) {
+ return -1;
+ }
+ TempAddr += sizeof(u32);
+ }
+ return 0;
+}
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