* struct dm_test_parent_data - parent's information on each child
*
* @sum: Test value used to check parent data works correctly
+ * @flag: Used to track calling of parent operations
*/
struct dm_test_parent_data {
int sum;
+ int flag;
};
/*
* @fail_count: Number of tests that failed
* @force_fail_alloc: Force all memory allocs to fail
* @skip_post_probe: Skip uclass post-probe processing
+ * @removed: Used to keep track of a device that was removed
*/
struct dm_test_state {
struct udevice *root;
int fail_count;
int force_fail_alloc;
int skip_post_probe;
+ struct udevice *removed;
};
/* Test flags for each test */