Merge branch 'master' of git://git.denx.de/u-boot-sunxi

[u-boot] / test / dm / i2c.c

diff --git a/test/dm/i2c.c b/test/dm/i2c.c
index 541b73b8037e0134078cb0817abcf5d202d54c87..772f62b265d0c37f48098bacd2d5fe88a7b8ea32 100644 (file)
--- a/test/dm/i2c.c
+++ b/test/dm/i2c.c
@@ -1,8 +1,7 @@
+// SPDX-License-Identifier: GPL-2.0+
 /*
  * Copyright (C) 2013 Google, Inc
  *
- * SPDX-License-Identifier:    GPL-2.0+
- *
  * Note: Test coverage does not include 10-bit addressing
  */
 
@@ -10,19 +9,19 @@
 #include <dm.h>
 #include <fdtdec.h>
 #include <i2c.h>
+#include <asm/state.h>
+#include <asm/test.h>
 #include <dm/device-internal.h>
 #include <dm/test.h>
 #include <dm/uclass-internal.h>
-#include <dm/ut.h>
 #include <dm/util.h>
-#include <asm/state.h>
-#include <asm/test.h>
+#include <test/ut.h>
 
 static const int busnum;
 static const int chip = 0x2c;
 
 /* Test that we can find buses and chips */
-static int dm_test_i2c_find(struct dm_test_state *dms)
+static int dm_test_i2c_find(struct unit_test_state *uts)
 {
        struct udevice *bus, *dev;
        const int no_chip = 0x10;
@@ -31,8 +30,8 @@ static int dm_test_i2c_find(struct dm_test_state *dms)
                                                       false, &bus));
 
        /*
-        * i2c_post_bind() will bind devices to chip selects. Check this then
-        * remove the emulation and the slave device.
+        * The post_bind() method will bind devices to chip selects. Check
+        * this then remove the emulation and the slave device.
         */
        ut_assertok(uclass_get_device_by_seq(UCLASS_I2C, busnum, &bus));
        ut_assertok(dm_i2c_probe(bus, chip, 0, &dev));
@@ -43,7 +42,7 @@ static int dm_test_i2c_find(struct dm_test_state *dms)
 }
 DM_TEST(dm_test_i2c_find, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
 
-static int dm_test_i2c_read_write(struct dm_test_state *dms)
+static int dm_test_i2c_read_write(struct unit_test_state *uts)
 {
        struct udevice *bus, *dev;
        uint8_t buf[5];
@@ -60,12 +59,15 @@ static int dm_test_i2c_read_write(struct dm_test_state *dms)
 }
 DM_TEST(dm_test_i2c_read_write, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
 
-static int dm_test_i2c_speed(struct dm_test_state *dms)
+static int dm_test_i2c_speed(struct unit_test_state *uts)
 {
        struct udevice *bus, *dev;
        uint8_t buf[5];
 
        ut_assertok(uclass_get_device_by_seq(UCLASS_I2C, busnum, &bus));
+
+       /* Use test mode so we create the required errors for invalid speeds */
+       sandbox_i2c_set_test_mode(bus, true);
        ut_assertok(i2c_get_chip(bus, chip, 1, &dev));
        ut_assertok(dm_i2c_set_bus_speed(bus, 100000));
        ut_assertok(dm_i2c_read(dev, 0, buf, 5));
@@ -73,12 +75,13 @@ static int dm_test_i2c_speed(struct dm_test_state *dms)
        ut_asserteq(400000, dm_i2c_get_bus_speed(bus));
        ut_assertok(dm_i2c_read(dev, 0, buf, 5));
        ut_asserteq(-EINVAL, dm_i2c_write(dev, 0, buf, 5));
+       sandbox_i2c_set_test_mode(bus, false);
 
        return 0;
 }
 DM_TEST(dm_test_i2c_speed, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
 
-static int dm_test_i2c_offset_len(struct dm_test_state *dms)
+static int dm_test_i2c_offset_len(struct unit_test_state *uts)
 {
        struct udevice *bus, *dev;
        uint8_t buf[5];
@@ -95,18 +98,22 @@ static int dm_test_i2c_offset_len(struct dm_test_state *dms)
 }
 DM_TEST(dm_test_i2c_offset_len, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
 
-static int dm_test_i2c_probe_empty(struct dm_test_state *dms)
+static int dm_test_i2c_probe_empty(struct unit_test_state *uts)
 {
        struct udevice *bus, *dev;
 
        ut_assertok(uclass_get_device_by_seq(UCLASS_I2C, busnum, &bus));
+
+       /* Use test mode so that this chip address will always probe */
+       sandbox_i2c_set_test_mode(bus, true);
        ut_assertok(dm_i2c_probe(bus, SANDBOX_I2C_TEST_ADDR, 0, &dev));
+       sandbox_i2c_set_test_mode(bus, false);
 
        return 0;
 }
 DM_TEST(dm_test_i2c_probe_empty, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
 
-static int dm_test_i2c_bytewise(struct dm_test_state *dms)
+static int dm_test_i2c_bytewise(struct unit_test_state *uts)
 {
        struct udevice *bus, *dev;
        struct udevice *eeprom;
@@ -161,7 +168,7 @@ static int dm_test_i2c_bytewise(struct dm_test_state *dms)
 }
 DM_TEST(dm_test_i2c_bytewise, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
 
-static int dm_test_i2c_offset(struct dm_test_state *dms)
+static int dm_test_i2c_offset(struct unit_test_state *uts)
 {
        struct udevice *eeprom;
        struct udevice *dev;