dm: usb: Clean up USB after each test

The USB subsystem has a few counters that need to be reset since they are
stored in static variables rather than driver-model data. An example is
usb_max_devs. Ultimately we should move this data into the USB uclass.

For now, make sure that USB is reset after each test, so that the counters
go back to zero.

Note: this is not a perfect solution: It a USB test fails it will exit
immediately and leave USB un-reset. The impact here is that it may cause
subsequence test failures in the same run.

Signed-off-by: Simon Glass <sjg@chromium.org>

diff --git a/test/dm/usb.c b/test/dm/usb.c
index 2d203541786264c91957c246b3916faceee3b97b..b46ae6060207b53022b0679949eaf59687db7653 100644 (file)
--- a/test/dm/usb.c
+++ b/test/dm/usb.c
@@ -52,6 +52,7 @@ static int dm_test_usb_flash(struct unit_test_state *uts)
        memset(cmp, '\0', sizeof(cmp));
        ut_asserteq(2, blk_dread(dev_desc, 0, 2, cmp));
        ut_assertok(strcmp(cmp, "this is a test"));
+       ut_assertok(usb_stop());
 
        return 0;
 }
@@ -67,6 +68,7 @@ static int dm_test_usb_multi(struct unit_test_state *uts)
        ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 0, &dev));
        ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 1, &dev));
        ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 2, &dev));
+       ut_assertok(usb_stop());
 
        return 0;
 }