*/
 }
 
-/*
- * issue write test command.
- * two variants are provided. one that just tests a write pattern and
- * another that tests datamask functionality.
+
+/**
+ * rw_mgr_mem_calibrate_write_test_issue() - Issue write test command
+ * @group:     Write Group
+ * @use_dm:    Use DM
+ *
+ * Issue write test command. Two variants are provided, one that just tests
+ * a write pattern and another that tests datamask functionality.
  */
-static void rw_mgr_mem_calibrate_write_test_issue(uint32_t group,
-                                                 uint32_t test_dm)
+static void rw_mgr_mem_calibrate_write_test_issue(u32 group,
+                                                 u32 test_dm)
 {
-       uint32_t mcc_instruction;
-       uint32_t quick_write_mode = (((STATIC_CALIB_STEPS) & CALIB_SKIP_WRITES) &&
-               ENABLE_SUPER_QUICK_CALIBRATION);
-       uint32_t rw_wl_nop_cycles;
-       uint32_t addr;
+       const u32 quick_write_mode =
+               (STATIC_CALIB_STEPS & CALIB_SKIP_WRITES) &&
+               ENABLE_SUPER_QUICK_CALIBRATION;
+       u32 mcc_instruction;
+       u32 rw_wl_nop_cycles;
 
        /*
         * Set counter and jump addresses for the right
                        &sdr_rw_load_jump_mgr_regs->load_jump_add1);
        }
 
-       addr = SDR_PHYGRP_RWMGRGRP_ADDRESS | RW_MGR_RUN_SINGLE_GROUP_OFFSET;
-       writel(mcc_instruction, addr + (group << 2));
+       writel(mcc_instruction, (SDR_PHYGRP_RWMGRGRP_ADDRESS |
+                               RW_MGR_RUN_SINGLE_GROUP_OFFSET) +
+                               (group << 2));
 }
 
 /**