*/
}
-/*
- * issue write test command.
- * two variants are provided. one that just tests a write pattern and
- * another that tests datamask functionality.
+
+/**
+ * rw_mgr_mem_calibrate_write_test_issue() - Issue write test command
+ * @group: Write Group
+ * @use_dm: Use DM
+ *
+ * Issue write test command. Two variants are provided, one that just tests
+ * a write pattern and another that tests datamask functionality.
*/
-static void rw_mgr_mem_calibrate_write_test_issue(uint32_t group,
- uint32_t test_dm)
+static void rw_mgr_mem_calibrate_write_test_issue(u32 group,
+ u32 test_dm)
{
- uint32_t mcc_instruction;
- uint32_t quick_write_mode = (((STATIC_CALIB_STEPS) & CALIB_SKIP_WRITES) &&
- ENABLE_SUPER_QUICK_CALIBRATION);
- uint32_t rw_wl_nop_cycles;
- uint32_t addr;
+ const u32 quick_write_mode =
+ (STATIC_CALIB_STEPS & CALIB_SKIP_WRITES) &&
+ ENABLE_SUPER_QUICK_CALIBRATION;
+ u32 mcc_instruction;
+ u32 rw_wl_nop_cycles;
/*
* Set counter and jump addresses for the right
&sdr_rw_load_jump_mgr_regs->load_jump_add1);
}
- addr = SDR_PHYGRP_RWMGRGRP_ADDRESS | RW_MGR_RUN_SINGLE_GROUP_OFFSET;
- writel(mcc_instruction, addr + (group << 2));
+ writel(mcc_instruction, (SDR_PHYGRP_RWMGRGRP_ADDRESS |
+ RW_MGR_RUN_SINGLE_GROUP_OFFSET) +
+ (group << 2));
}
/**